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    Author(s): Michael E. Devey; Annette Delfino-Mix1; Bohun B. Kinloch; David B. NEALEt
    Date: 1995
    Source: Prac. Nail. Acad. Sci. USA Vol. 92, p. 2066-2070
    Publication Series: Miscellaneous Publication
    PDF: Download Publication  (1.0 MB)


    We have genetically mapped a gene for resistance to white pine blister rust (Cronartium ribicola Fisch.) in sugar pine (Pinus lambertiana Dougl.) by using an approach which relies on three factors: (i) the ability to assay for genetic markers in the haploid stage of the host's life cycle, using megagametophyte seed tissue; (ii) a simple and clearly defined pathosystem; and (iii) the use of random amplified polymorphic DNA (RAPD) markers that can be quickly and efficiently evaluated. Resistance to white pine blister rust in sugar pine is known to be controlled by a single dominant gene (R). Maternal segregation of R and dominant RAPD markers were scored simultaneously following collection of megagametophytes for DNA assays and seedling inoculation with C. ribicola. Bulked samples of haploid megagametophyte DNA from resistant and susceptible offspring of segregating full-sib and half-sib families were used to evaluate 800 random decanucleotide primers. Ten loci linked with the gene for resistance to white pine blister rust were identified and segregation data were obtained from five families. Six of the linked markers were within 5 centimorgans of the gene, and one marker was 0.9 centimorgan from R. These and other markers derived by this approach may provide starting points for map-based cloning of this important gene.

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    Michael E. Devey*, Annette Delfino-Mix1, Bohun B. Kinloch, jR.t, and David B. NEALEt 1995. Random amplified polymorphic DNA markers tightly linked to a gene for resistance to white pine blister rust in sugar pine. Prac. Nail. Acad. Sci. USA Vol. 92, p. 2066-2070

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